LINE STRESSES AFFECT MFL DEFECT INDICATIONS

David L. Atherton, Ajay Dhar, Christian Hauge Queen's University Kingston, Ontario Poul Laursen Pipetronix Toronto Pipeline-defect measurements by high-resolution magnetic flux leakage (MFL) in-line inspection tools are influenced by bending and line-pressure stresses. Tests conducted on a single 36-in. sample with a machined defect indicate that much further research into this phenomenon is needed to reveal methods for correcting for stress effects.

More in Home